Structure and morphology of nano-sized W-Ti/Si thin films

Journal of the Serbian Chemical Society

Volumn 71, Issue 8-9, 2006, Pages 969-976

  Petrović, Suzana M ^a   Adnadjević, Borivoje ^b   Peruško, Davor ^b   Popović, Nada ^a   Bundaleski, Nenad ^a   Radović, Milan ^a   Gaković, Biljana ^a   Rakočević, Zlatko ^a  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b Faculty of Physical Chemistry   (Serbia)

Author keywords

Low energy ions scattering (LEIS); PVD W Ti thin film; Scanning tunnelling microscopy (STM); X ray diffraction (XRD)

Indexed keywords

EID: 33751424871     PISSN: 03525139     EISSN: 03525139     Source Type: Journal    
DOI: 10.2298/JSC0609969P     Document Type: Article

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