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Volumn 55, Issue 1, 2007, Pages 251-260

Creep-driven nitride scale growth in γ-TiAl

Author keywords

Creep; Nitride; Residual stress; Titanium aluminide

Indexed keywords

BENDING (DEFORMATION); CREEP; GROWTH (MATERIALS); MATHEMATICAL MODELS; NITRIDES; RESIDUAL STRESSES; X RAY DIFFRACTION;

EID: 33751396955     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.07.024     Document Type: Article
Times cited : (9)

References (37)
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  • 22
    • 33751424098 scopus 로고    scopus 로고
    • JCPDS - International Center for Diffraction Data #38-1420.
  • 23
    • 33751441015 scopus 로고    scopus 로고
    • GADDS 4.0 User's Manual, Bruker Advanced X-ray Solutions, Madison, WI, 1999.
  • 26
    • 29244439262 scopus 로고    scopus 로고
    • Leyens C., and Peters M. (Eds), Wiley, Weinheim, Germany
    • Appel F., and Oehring M. In: Leyens C., and Peters M. (Eds). Titanium and titanium alloys (2003), Wiley, Weinheim, Germany 89
    • (2003) Titanium and titanium alloys , pp. 89
    • Appel, F.1    Oehring, M.2
  • 34
    • 33751404592 scopus 로고    scopus 로고
    • J. Magnan, M.Eng. Thesis, McMaster University; 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.