Relaxation processes in dielectric and electromechanical response of PZT thin films under nanoindentation

Ferroelectrics

Volumn 318, Issue , 2005, Pages 55-61

  Koval, V ^a,b   Reece, M J ^a   Bushby, A J ^a  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^b INSTITUTE OF MATERIALS RESEARCH   (Slovakia)

Author keywords

Domains; Electromechanic; Nanoindentation; PZT; Relaxation; Thin film

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC CURRENTS; FERROELECTRICITY; LEAD COMPOUNDS; MEASUREMENT THEORY; RELAXATION PROCESSES; SHORT CIRCUIT CURRENTS;

ELECTROMECHANICS; FERROELECTRIC DOMAINS; INDENTATION FORCES; NANOINDENTATION;

THIN FILMS;

EID: 33751267038     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190590966027     Document Type: Article

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