Growing one-dimensional metallic nanowires by dielectrophoresis

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Volumn 2, Issue 12, 2006, Pages 1490-1496

  Ranjan, Nitesh ^a   Vinzelberg, Hartmut ^b   Mertig, Michael ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

Conductivity; Electrophoresis; Nanowires; Palladium; Self assembly

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTROPHORESIS; PALLADIUM COMPOUNDS; SELF ASSEMBLY;

ELECTRON-TRANSPORT PROPERTIES; NANOELECTRONICS; NANOWIRES;

NANOSTRUCTURED MATERIALS;

GOLD; NANOWIRE; PALLADIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTRONICS; ELECTROPHORESIS; METHODOLOGY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; ULTRASTRUCTURE;

ELECTRIC CONDUCTIVITY; ELECTRONICS; ELECTROPHORESIS; GOLD; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOWIRES; PALLADIUM; TEMPERATURE;

EID: 33751233262     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200600350     Document Type: Article

References (43)

1. D. Appell, Nature 2002, 419, 553-555.
2. R. Saito, M. S. Dresselhaus, G. Dresselhaus, Physical Properties of Carbon Nanotubes, World Scientific Publishing Company, London, 1998.
3. a) K. A. Williams, P. T. M. Veenhuizen, B. G. de La Torre, R. Eritja, C. Dekker, Nature 2002, 420, 761;
4. b) M. Zheng, A. Jagota, E. D. Semke, B. A. Diner, R. S. McLean, S. R. Lustig, R. E. Richardson, N. G. Tassi, Nat Mater. 2003, 2, 338-342.
5. R. Krupke, F. Hennrich, H. B. Weber, M. M. Kappes, H. von Löhneysen, Nano Lett. 2003, 3, 1019-1023.
6. K. H. Choi, J. P. Bourgoin, S. Auvray, D. Esteve, G. S. Duesberg, S. Roth, M. Burghard, Surf. Sci. 2000, 462, 195-202.
7. Y. M. Wang, W. Q. Man, A. Zettl, New J. Phys. 2004, 6, 15.
8. a) A. M. Morales, C. M. Lieber, Science 1998, 279, 208-211;
9. b) X. Duan, C. M. Lieber, Adv. Mater. 1999, 11, 298-302;
10. M. H. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, P. Yang, Science 2001, 292, 1897-1899.
11. Y. Huang, X. Duan, Q. Wie, C. M. Lieber, Science 2001, 291, 630-633.
12. C. A. Foss, M. J. Tierney, C. R. Martin, J. Phys. Chem. 1992, 96, 9001-9007;
13. K. Nielsch, F. Müller, A.-P. Li, U. Gösele, Adv. Mater. 2000, 12, 582-586;
14. A. J. Yin, J. Li, W. Jian, A. J. Bennett, J. M. Xua, Appl. Phys. Lett. 2001, 79, 1039-1041.
15. M. P. Zach, K. H. Ng, R. M. Penner, Science 2000, 290, 2120-2123.
16. a) E. Braun, Y. Eichen, U. Sivan, G. Ben-Yoseph, Nature 1998, 391, 775-778;
17. b) J. Richter, R. Seidel, R. Kirsch, M. Mertig, W. Pompe, J. Plaschke, H. K. Schackert, Adv. Mater. 2000, 12, 507-510;
18. c) J. Richter, M. Mertig, W. Pompe, I. Mönch, H. K. Schackert, Appl. Phys. Lett. 2001, 78, 536-538;
19. d) J. Lund, J. Dong, Z. Deng, C. Mao, B. A. Parviz, Nanotechnology 2006, 17, 2752-2757.
20. H. Liu, Y. Chen, Y. He, A. E. Ribbe, C. Mao, Angew. Chem. 2006, 118, 1976-1979;
21. Angew. Chem. Int. Ed. 2006, 45, 1942-1945.
22. R. Kirsch, M. Mertig, W. Pompe, R. Wahl, G. Sadowski, K. J. Böhm, E. Unger, Thin Solid Films 1997, 305, 248-253.
23. a) H. Ohnishi, Y. Kondo, K. Takayanagi, Nature 1998, 395, 780-783;
24. b) N. Agrait, A. Levy Yeyati, J. M. van Ruitenbeek, Phys. Rep. 2003, 377, 81-279.
25. H. A. Pohl, Dielectrophoresis, Cambridge University Press, Cambridge, UK, 1978.
26. a) R. Pethig, Y. Huang, X. B. Wang, J. P. H. Burt, J. Phys. D 1992, 25, 881 -888;
27. b) T. Müller, A. Gerardino, T. Schnelle, S. G. Shirley, F. Bordoni, G. De Gasperis, R. Leonix, G. Fuhr, J. Phys. D 1996, 29, 340-349;
28. c) O. D. Velev, E. W. Kaler, Langmuir 1999, 15, 3693-3698.
29. a) K. D. Hermanson, S. O. Lumsdon, J. P. Williams, E. W. Kaler, O. D. Velev, Science 2001, 294, 1082-1086;
30. b) S. O. Lumsdon, D. M. Scott, Langmuir 2005, 21, 4874-4880;
31. K. H. Bhatt, O. D. Velev, Langmuir 2004, 20, 467-476.
32. L. Dong, J. Bush, V. Chirayos, R. Solanki, J. Jiao, Y. Ono, J. F. Conley, Jr., B. D. Ulrich, Nano Lett. 2005, 5, 2112-2115.
33. a) R. Krupke, F. Hennrich, H. von Löhneysen, M. M. Kappes, Science 2003, 301, 344-347;
34. b) D. Sickert, S. Taeger, A. Neumann, O. Jost, G. Eckstein, M. Mertig, W. Pompe, AIP Conf. Proc. 2004, 786, 271-274.
35. a) C. Cheng, R. K. Gonela, Q. Gu, D. T. Haynie, Nano Lett. 2005, 5, 175-178;
36. b) C. Cheng, D. T. Haynie, Appl. Phys. Lett. 2005, 87, 263 112.
37. M. P. Hughes, Nanotechnology 2000, 11, 124-132.
38. B. Chester, T. O'Konski, J. Phys. Chem. 1960, 64, 605-619.
39. C. L. Asbury, A. H. Diercks, G. van den Engh, Electrophoresis 2002, 23, 2658-2666.
40. D. Grier, E. Ben-Jacob, R. Clarke, L. M. Sander, Phys. Rev. Lett. 1986, 56, 1264-1267.
41. a) T. A. Witten, L. M. Sander, Phys. Rev. Lett. 1981, 47, 1400-1403;
42. b) T. Vicsek, Phys. Rev. Lett. 1984, 53, 2281 - 2284.
43. P. A. Lee, T. V. Ramakrishanan, Rev. Mod. Phys. 1985, 57, 287-337.