Optical and structural properties of copper oxide thin films grown by oxidation of metal layers

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 2428-2432

  Papadimitropoulos, G ^a   Vourdas, N ^a   Vamvakas, V Em ^a   Davazoglou, D ^a  

^a INSTITUTE OF MICROELECTRONICS   (Greece)

Author keywords

Cuprous Oxide; Optical properties; Structural properties

Indexed keywords

ATMOSPHERIC PRESSURE; COPPER OXIDES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; OXIDATION; REFRACTIVE INDEX; SILICON; X RAY DIFFRACTION;

CUPROUS OXIDE; LOCALIZED STATES; STRUCTURAL PROPERTIES; TAUC LORENTZ (TL) MODELS;

THIN FILMS;

EID: 33751229932     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.06.002     Document Type: Article

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