Thionin adsorption on silicon (1 0 0): Structural analysis

Applied Surface Science

Volumn 253, Issue 4, 2006, Pages 1978-1982

  Miotto, R ^a   Cunha, J F R ^a   da Silva, S W ^a   Soler, M A G ^a   Morais, P C ^a   Ferraz, A C ^b   Tada, Dayane B ^b   Petri, D F S ^b   Baptista, Mauricio S ^b  

^a UNIVERSITY OF BRASILIA   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Chemisorption; Ellipsometry; Raman spectroscopy; Scanning force microscopy; Surface electronic phenomena; Thionin

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CHEMISORPTION; MOLECULAR VIBRATIONS; MONOLAYERS; PHOTODYNAMIC THERAPY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON;

FUNCTIONAL AMINES; SURFACE ELECTRONIC PHENOMENA; THIONIN;

SULFUR COMPOUNDS;

EID: 33751205315     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.03.051     Document Type: Article

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