FIB milled PZT nanocapacitors tested using PFM

Integrated Ferroelectrics

Volumn 61, Issue , 2004, Pages 223-230

  Marshall, J M ^a   Dunn, S ^a   Whatmore, R W ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

77.80.Dj domain structure; 77.80.Fm switiching phenomena; 77.84.Dy niobates; Hysteresis; Nanocapacitors 68.73.Ps atomic force microscopy (AFM); PZT; PZT ceramics; Tantalates; Titanates

Indexed keywords

77.80.DJ DOMAIN STRUCTURE; 77.80.FM SWITICHING PHENOMENA; 77.84.DY NIOBATES; NANOCAPACITORS 68.73.PS; PZT; PZT CERAMICS; TANTALATES; TITANATES;

ATOMIC FORCE MICROSCOPY; CAPACITORS; ELECTRODES; FERROELECTRIC MATERIALS; HYSTERESIS;

NANOTECHNOLOGY;

EID: 33751162628     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580490459972     Document Type: Article

References (11)

1. C. S. Ganpule, V. Nagarajan, S. B. Ogale, A. L. Roytburd, E. D. Williams, and R. Ramesh, "Domain nucleation and relaxation in thin films," App. Phys. Let. 77(20), 3275 (2000);
2. Mat. 44.1175-1179(2001).
3. 3 thin films," J. App. Phys. 93(1), 545-550 (2003).
4. S. Tiedke, T. Schmitz, K. Prume, A. Roelofs, T. Schneller, U. Kall, R. Waser, C. S. Ganpule, V. Nagrajan, A. Stanshevsky, and R. Ramesh, "Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope," App. Phys. Let. 79(22), 3678-3680 (2001).
5. L. M. Eng, "Nanoscale domain engineering and characterization of ferroelectric domains," Nanotech 10, 405-411.
6. A. Gruverman, "Scaling effects on statistical behaviour of switching parameters of ferroelectric capacitors," App. Phys. Let. 75(10), 1452-1454 (1999).
7. A. Gruverman, O. Auciello, R. Ramesh, and H. Tokumoto, "Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control," Nanotech. 8, 38-43 (1997).
8. V. Nagarajan, A. Roytburd, A. Stanishevisky, S. Prasertchoung, T. Zhao, L. Chen, J. Melngailis, O. Auchiello, and R. Ramesh, "Dynamics of ferroelastic domains in ferroelectric thin films," Nat. Mat. 2, 43-47 (2003).
9. A. Gruverman, A. Kholkin, A. Kingon, and H. Tokumoto, "Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy," App. Phys. Let. 78(18), 2751-2753 (2001).
10. 2 top electrode," IEEE Proc. 12th ISAF 2001 Honolulu HI 177-180 (2001).
11. Q. Zhang, R. W. Whatmore, M. E. Vickers, and Z. Huang, "Structural studies on sols for PZT thin films." IEE Colloquium on Sol-Gel Materials for Device Applications 1-6 (1998).