Influence of doping upon the phase change characteristics of Ge 2Sb2Te5

Microsystem Technologies

Volumn 13, Issue 2, 2007, Pages 203-206

  Wang, K ^a   Steimer, C ^a   Wamwangi, D ^a   Ziegler, S ^a   Wuttig, M ^a   Tomforde, J ^b   Bensch, W ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; DENSITY (OPTICAL); GERMANIUM COMPOUNDS; PHASE SEPARATION; PHASE TRANSITIONS; REFLECTOMETERS; X RAY DIFFRACTION;

ATOMIC RADII; OPTICAL CONTRAST; ULTRAFAST CRYSTALLIZATION; X RAY REFLECTOMETRY (XRR);

DOPING (ADDITIVES);

EID: 33751084047     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-006-0156-5     Document Type: Conference Paper

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