The scaling challenges of CMOS and the impact on high-density non-volatile memories

Microsystem Technologies

Volumn 13, Issue 2, 2007, Pages 133-138

  Baldi, L ^a   Bez, Roberto ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FLASH MEMORY; NAND CIRCUITS; ROM; TECHNOLOGY;

DIGITAL CONSUMER APPLICATION; NON-VOLATILE MEMORIES; STORAGE TECHNOLOGIES;

CMOS INTEGRATED CIRCUITS;

EID: 33751075447     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-006-0157-4     Document Type: Conference Paper

References (8)

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8. 2 cell size for 4 Gb flash memory. IEEE IEDM Tech Digest, Session 34