SCOPUS 정보 검색 플랫폼

Proceedings - Design Automation Conference

Volumn , Issue , 1981, Pages 347-354

Automatic test generation for stuck-open faults in CKOS VLSI

(1) Elziq, Yacoub M a

a HONEYWELL (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; METALS; MOS DEVICES; OXIDE SEMICONDUCTORS; VLSI CIRCUITS;

AUTOMATIC TEST GENERATION; CMOS (COMPLEMENTARY METAL OXIDE SEMICONDUCTOR); CONVENTIONAL TESTING; LOW-POWER DISSIPATION; STEP-BY-STEP ALGORITHM; STUCK-OPEN FAULTS; TEST GENERATIONS; TEST PATTERN GENERATIONS;

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING;

EID: 33751072538 PISSN: 0738100X EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (37)

References (9)

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- Wollesen, D.L.¹

2
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- ISSCC 77, Digest of Technical Papers , pp. 138-139
- Couper, J.A.¹

3
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- Workshop report: Fault-tolerant VLSI design
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- Siewiorek, D.¹ Rennels, D.²

4
- 0019029590
- Physical versus logical fault models MOS LSI: Impact on their testability
- June
- J. Galiay, et al., "Physical versus Logical Fault Models MOS LSI: Impact on Their Testability", IEEE Transaction on Computers, Vol. C-29, No. 6, June 1980, pp. 527-531.
- (1980) IEEE Transaction on Computers , vol.C-29 , Issue.6 , pp. 527-531
- Galiay, J.¹

5
- 0017961684
- Fault modeling and logic simulators of CMOS and MOS integrated circuits
- May-June
- R. L. Wadsack, "Fault Modeling and Logic Simulators of CMOS and MOS integrated circuits", Bell System Technical Journal, Vol. 57, May-June, pp. 1449-1473.
- Bell System Technical Journal , vol.57 , pp. 1449-1473
- Wadsack, R.L.¹

6
- 0019189885
- VLSI-The inadequacy of the stuck-at fault model
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- 1980 Test Conference, IEEE Catalog Number CH1608-9 , pp. 378-381
- Nickel, V.V.¹

7
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- A logic design structure for LSI testability
- June
- E. G. Eichelberger and T. W. Williams, "A Logic Design Structure for LSI Testability", Proceedings of the 14th Design Automation Conference, IEEE Catalog Number 77 CH 1216-1C, June 1977, pp. 462-468.
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- Eichelberger, E.G.¹ Williams, T.W.²

8
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- Testing of a special VLSI design
- Spring
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9
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- Diagnosis and reliable design of digital systems
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.