VLSI - THE INADEQUACY OF THE STUCK AT FAULT MODEL.

Journal of Biomedical Engineering

Volumn , Issue , 1980, Pages 378-381

  Nickel, Vincent V ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING;

LOGIC CIRCUITS;

EID: 0019189885     PISSN: 01415425     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (0)