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Volumn 57, Issue 5, 1978, Pages 1449-1474

Fault Modeling and Logic Simulation of CMOS and MOS Integrated Circuits

(1)  Wadsack, R L a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DESIGN;

EID: 0017961684     PISSN: 00058580     EISSN: 15387305     Source Type: Journal    
DOI: 10.1002/j.1538-7305.1978.tb02106.x     Document Type: Article
Times cited : (318)

References (7)
  • 1
    • 84944811478 scopus 로고
    • “lamp: Logic Analyzer for Maintenance Planning,”
    • (1974) B.S.T.J. , vol.53 , Issue.8 , pp. 1431-1555
  • 3
    • 84944822264 scopus 로고
    • “Interactive Logic Simulation and Test Pattern Development for Digital Circuitry,”
    • Paper 26.2
    • (1976) Electro , pp. 76
    • Rombeek, H.1    Wilcox, P.2
  • 5
    • 84944822266 scopus 로고    scopus 로고
    • The first successful demonstration of the fdl capability was performed for the nor gate faults in Table I
    • Strebendt, R.E.1
  • 6
    • 84944822267 scopus 로고    scopus 로고
    • The logic symbol was suggested to the author by
    • Kushler, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.