Sensitivity of on-wafer interconnects to CMOS process parameters at radio frequency

17th International Zurich Symposium on Electromagnetic Compatibility, 2006

Volumn 2006, Issue , 2006, Pages 590-593

  Shi, Xiaomeng ^a,b   Jianguo, Ma ^a   Li, Erping ^b   Yeo, Kiat Seng ^a   Do, Manh Anh ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

INTERCONNECTION NETWORKS; REFLECTION; SCATTERING PARAMETERS; WSI CIRCUITS;

ON WAFER INTERCONNECTS; RADIO FREQUENCY; REFLECTION CAPACITIES; STATE OF THE ART;

CMOS INTEGRATED CIRCUITS;

EID: 33751023787     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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