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Applied Surface Science

Volumn 183, Issue 3-4, 2001, Pages 205-215

Quantitative assessment of surface roughness as measured by AFM: Application to polished human dentin

(5) El Feninat, F a Elouatik, S a Ellis, T H a Sacher, E b Stangel, I c

a UNIVERSITÉ DE MONTRÉAL (Canada)

b ÉCOLE POLYTECHNIQUE DE MONTRÉAL (Canada)

c MCGILL UNIVERSITY (Canada)

Author keywords

Atomic force microscopy (AFM); Fractal dimension; Polished human dentin; Power spectrum (PS); Surface roughness

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; BLEACHING; ETCHING; FOURIER TRANSFORMS; SPECTRUM ANALYSIS;

POLISHED HUMAN DENTIN; POWER SPECTRUM (PS);

SURFACE ROUGHNESS;

EID: 0035965609 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(01)00558-X Document Type: Article

Times cited : (55)

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