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Volumn 74, Issue 19, 2006, Pages

Statistics of electron tunneling in normal tunnel junctions: An analytical and numerical study including circuit effects

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EID: 33750986761     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.195322     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.