Shot-noise-driven escape in hysteretic Josephson junctions

Physical Review Letters

Volumn 95, Issue 19, 2005, Pages

  Pekola, J P ^a   Nieminen, T E ^a   Meschke, M ^a   Kivioja, J M ^a   Niskanen, A O ^a,b   Vartiainen, J J ^a  

^a AALTO UNIVERSITY   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

HYSTERETIC JOSEPHSON JUNCTIONS; MACROSCOPIC QUANTUM TUNNELING; SCATTERING CONDUCTORS; THERMAL ACTIVATION (TA);

ELECTRON TUNNELING; HYSTERESIS; QUANTUM THEORY; SHOT NOISE; THERMAL EFFECTS;

SEMICONDUCTOR JUNCTIONS;

EID: 28844496405     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.197004     Document Type: Article

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