Functionalized holders for 3D S/TEM imaging and analysis of nanoparticles

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1556-1557

  Jarausch, Konrad ^a   Leonard, Donovan ^b   Kamino, Takeo ^c  

^a Hitachi High Technologies America   (United States)

^b North Carolina State University   (United States)

^c HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750893133     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606068620     Document Type: Conference Paper

References (5)

1. Kamino T. et. al., T J. Electron Microscopy 53(6) (2004) 583-588
2. Cerruti M., et. al., submitted to Analytical Chemistry, publication expected in 2006.
3. Yaguchi T et. al., Microsc. Microanal. 7 (2002) 938-939
4. Bowen R, Hilal N., Lovitt, R., Wright, C. Colloids and Surfaces A 157 (1999) 117-125
5. Westcott S., Oldenburg S., Lee T.R., Halas N. Langmuir 14 (1998) 5396-5401