A bent silicon crystal in the Laue geometry to resolve actinide x-ray fluorescence for x-ray absorption spectroscopy

Physica Scripta T

Volumn T115, Issue , 2005, Pages 998-1000

  Kropf, A J ^a   Fortner, J A ^a   Finch, R J ^a   Cunnane, J C ^a   Karanfil, C ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; FLUORESCENCE MICROSCOPY; X RAY ABSORPTION SPECTROSCOPY;

ACTINIDE ELEMENTS; SIGNAL-TO-BACKGROUND RATIO;

SILICON;

EID: 33750878242     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00998     Document Type: Article

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