A bent laue analyzer detection system for dilute fluorescence XAFS

AIP Conference Proceedings

Volumn 521, Issue , 2000, Pages 178-182

  Karanfil, C ^a   Zhong, Z ^b   Chapman, L D ^a   Fischetti, R ^a   Bunker, G B ^a   Segre, C U ^a   Bunker, B A ^c  

^a ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAYS;

DETECTION SYSTEM; FLUORESCENCE LINES; FLUORESCENCE RADIATIONS; LAUE ANALYZER; LOGARITHMIC SPIRAL; MEASUREMENTS OF; SILICON CRYSTAL; X-RAY SOURCES;

FLUORESCENCE;

EID: 0004567765     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1291781     Document Type: Conference Paper

References (3)

1. Zhang K, Rosenbaum G., Bunker G., J. Synchrotron Rad. 6, 220-221 (1999).
2. Sakayanagi Y., Jap. J. Appl Phys. 21, L225-L226 (1982).
3. Zhong Z., Chapman D., Bunker B.A., Bunker G.B., Fischetti R. and Segre C.U., J. Synchrotron Rad. 6, 212-214 (1999).