Combined SEM electron-beam-induced current and cathodoluminescence imaging and STEM structural analysis of GaN light emitting diodes

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1514-1515

  Parish, C M ^a   Progl, C L ^a   Salmon, M E ^a   Russell, P E ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750875470     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606066578     Document Type: Conference Paper

References (3)

1. A. Y. Polyakov et al., Solid State Electronics, 47 (2003), 51.
2. F. A. Ponce et al., Applied Physics Letters, 68(1) (1996), 57.
3. L. Chernyak et al., Solid State Electronics, 45 (2001), 1687.