Quantitative analysis of atomic resolution HAADF-STEM (Z-contrast) imaging for PbTiO3 / SrTiO3 substrate dielectric thin films

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1352-1353

  Kotaka, Y ^a   Honda, K ^a   Yamazaki, T ^b   Watanabe, K ^c   Fujisawa, H ^d   Shimizu, M ^d  

^a FUJITSU LABORATORIES LTD   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

^c TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750866938     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606063161     Document Type: Conference Paper

References (7)

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4. R. F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum New York (1981) 302.
5. N. Nakanishi et al., Ultramicroscopy 106, (2006) 233.
6. K. Watanabe et al., Ultramicroscopy 92 (2002) 191.
7. K. Watanabe et al., Phys. Rev. B 64 (2001) 115432.