Calculation of X-ray spectra for a side window tube

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 858-859

  Procop, M ^a   Hodoroaba, V D ^a   Bjeoumikhov, A ^b  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b Institut fuer Wissenschaftlichen Geraetebau (IfG)   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750846661     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606123X     Document Type: Conference Paper

References (10)

1. A. Bjeoumikhov et al., X-ray spectrom. 34 (2005), 493.
2. B.J. Cross & K.C. Witherspoon, Microscopy Today 12 (2004), 20.
3. X-ray tube MCMB50, Roentgentechnik Warrikhoff, D-xxxx Neuenhagen, Germany
4. F. Scholze & M. Procop, X-ray Spectrom 30 (2001), 69.
5. M. Procop, Microsc. Microanal. 10 (2004), 481.
6. th European Workshop on Modern Developments and Applications in Microbeam Analysis, Florence, Italy, 2005, 189 (submitted to Microsc. Microanal.).
7. J.L. Pouchou & F. Pichoir, Electron Probe Quantitation, Plenum Press 1991, p.31.
8. D.C. Joy, J.Microscopy 191, Pt.1 (1998), 74.
9. W.T. Elam et al. Radiation Phys. Chem. 63 (2001), 121.
10. J.L. Pouchou et al., Proceedings XII ICXOM, Krakow 1989, 52.