Characterisation of YBa2Cu3O6+x films grown by the trifluoro-acetate metal organic decomposition route by infrared spectroscopy

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 1607-1611

  Rousseau, B ^a   Canizares, A ^a   Veron E ^a   Ramy Ratiarison, R ^a   Blin, A ^a   De Sousa Meneses, D ^a   Simon, P ^a   Berberich, F ^b   Graafsma, H ^b   Pomar, A ^c   Mestres, N ^c   Puig, T ^c   Obradors, X ^c  

^a Centre National de la Recherche Scientifique   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

Chemical solution deposition; Effective medium approximation; Infrared reflectivity; Raman scattering

Indexed keywords

COMPUTER SIMULATION; FILM GROWTH; INFRARED SPECTROSCOPY; POROSITY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

CHEMICAL SOLUTION DEPOSITION; EFFECTIVE MEDIUM APPROXIMATION; INFRARED REFLECTIVITY;

YTTRIUM BARIUM COPPER OXIDES;

EID: 33750827049     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.05.027     Document Type: Article

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