Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films

Journal of Materials Research

Volumn 20, Issue 12, 2005, Pages 3270-3273

  Berberich, F ^a   Graafsma, H ^a   Rousseau, Benoit ^b   Canizares, A ^b   Ratiarison, R Ramy ^b   Raimboux, N ^b   Simon, P ^b   Odier, P ^c   Mestres, N ^d   Puig, T ^d   Obradors, X ^d  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CNRS   (France)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^d UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; DECOMPOSITION; FILM GROWTH; LANTHANUM COMPOUNDS; RAMAN SPECTROSCOPY; SUBSTRATES; SYNCHROTRON RADIATION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

METAL ORGANIC DECOMPOSITION; SYNCHROTRON X-RAY DIFFRACTION; TRIFLUOROACETATE;

YTTRIUM BARIUM COPPER OXIDES;

EID: 30444433524     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2005.0421     Document Type: Article

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