The barrel modules of the ATLAS semiconductor tracker
(264)
Abdesselam, A
v
Akimoto, T
ae
Allport, P P
o
Alonso, J
n
Anderson, B
af
Andricek, L
r
Anghinolfi, F
e
Apsimon, R J
aa
Barbier, G
i
Barr, A J
d,af
Batchelor, L E
aa
Bates, R L
j
Batley, J R
d
Beck, G A
z
Bell, P J
e,p
Belymam, A
z
Bernabeu, J
ah
Bethke, S
r
Bizzell, J P
aa
Bohm, J
x
Brenner, R
ag
Brodbeck, T J
m
Broklova, Z
w
Broz, J
w
Bruckman De Renstrom, P
f,v
Buttar, C M
j
Butterworth, J M
af
Carpentieri, C
h
Carter, A A
z
Carter, J R
d
Charlton, D G
c
Cheplakov, A
j
Chesi, E
e
Chilingarov, A
m
Chouridou, S
ab
Chu, M L
ad
Cindro, V
k
Ciocio, A
n
Civera, J V
ah
Clark, A
i
Coe, P
v
Colijn, A P
s
Cornelissen, T
s
Cosgrove, D P
ab
Costa, M J
e
Dabrowski, W
g
Dalmau, J
z
Danielsen, K M
u
Dawson, I
ac
Demirkoz, B
v
Dervan, P
o,ac
Dolezal, Z
w
Donega, M
e,i
D'Onofrio, M
i
Dorholt, O
u
Dowell, J D
c
Drasal, Z
w
Duerdoth, I P
p
Dwuznik, M
g
Eckert, S
h
Ekelof, T
ag
Eklund, L
ag
Escobar, C
ah
Fadeyev, V
n
Feld, L
h
Ferrari, P
e
Ferrere, D
i
Fiorini, L
d
Fortin, R
e
Foster, J M
p
Fox, H
h
Fraser, T J
af
Freestone, J
p
French, R
ac
Fuster, J
ah
Gadomski, S
f
Gallop, B J
c,aa
Garcia C
ah
Garcia Navarro, J E
ah
Gibson, M D
aa
Gibson, S
v
Gilchriese, M G D
n
Godlewski, J
e,f
Gonzalez Sevilla, S
ah
Goodrick, M J
d
Gorisek, A
e
Gornicki, E
f
Greenall, A
o
Grigson, C
ac
Grillo, A A
ab
Grosse Knetter, J
e
Haber, C
n
Hara, K
ae
Hartjes, F G
s
Hauff, D
r
Hawes, B M
v
Haywood, S J
aa
Hessey, N P
s
Hicheur, A
aa
Hill, J C
d
Hollins, T I
c
Holt, R
aa
Howell, D F
v
Hughes, G
m
Huse, T
u
Ibbotson, M
p
Ikegami, Y
l
Issever, C
v
Jackson, J N
o
Jakobs, K
h
Jarron, P
e
Johansen, L G
b
Jones, T J
o
Jones, T W
af
de Jong, P
s
Joos, D
h
Jovanovic, P
c
Kachiguine, S
ab
Kaplon, J
e
Kato, Y
ae
Ketterer, C
h
Kobayashi, H
ae
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w
Koffeman, E
s
Kohout, Z
y
Kohriki, T
l
Kondo, T
l
Koperny, S
g
Kramberger, G
k
Kubik, P
w
Kudlaty, J
r
Kuwano, T
ae
Lacasta, C
ah
LaMarra, D
i
Lane, J B
af
Lee, S C
ad
Lester, C G
d
Limper, M
s
Lindsay, S
o,q
Llatas, M C
i
Loebinger, F K
p
Lozano, M
a
Ludwig, I
h
Ludwig, J
h
Lutz, G
r
Lys, J
n
Maassen, M
h
Macina, D
e,i
Macpherson, A
e
MacWaters, C
aa
McMahon, S J
aa
McMahon, T J
c
Magrath, C A
s
Malecki, P
f
Mandic I
k
Mangin Brinet, M
i
Marti Garcia S
ah
Martinez Mckinney, G F M
ab
Matheson, J M C
aa
Matson, R M
aa
Meinhardt, J
h
Mikulec, B
i
Mikuz M
k
Minagawa, M
ae
Mistry, J
z
Mitsou, V
ah
Modesto, P
ah
Moed S
i
Mohn, B
b
Moorhead, G
q
Morin, J
z
Morris, J
z
Morrissey, M
aa
Moser, H G
r
Muijs, A J M
s
Murray, W J
aa
Nagai, K
z
Nakamura, K
ae
Nakamura, Y
ae
Nakano, I
t
Nichols, A
aa
Nicholson, R
ac
Nickerson, R B
v
Nisius, R
r
O'Shea, V
j
Oye, O K
b
Palmer, M J
d
Parker, M A
d
Parzefall, U
h
Pater, J R
p
Peeters, S J M
s
Pellegrini, G
a
Pernegger, H
e
Perrin, E
i
Phillips, A
d
Phillips, P W
aa
Poltorak, K
g
Pospisil, S
y
Postranecky, M
af
Pritchard, T
e
Rafi, J M
a
Ratoff, P N
m
Reznicek, P
w
Richter, R H
r
Robinson, D
d
Roe, S
e
Rosenbaum, F
ab
Rudge, A
e
Runge, K
h
Sadrozinski, H F W
ab
Sandaker, H
u
Saxon, D H
j
Schieck, J
r
Sedlak, K
v
Seiden, A
ab
Sengoku, H
ae
Sfyrla, A
i
Shimma, S
ae
Smith, K M
j
Smith, N A
o
Snow, S W
p
Solar, M
y
Solberg, A
b
Sopko, B
y
Sospedra, L
ah
Spencer, E
ab
Stanecka, E
e,f
Stapnes, S
u
Stastny, J
x
Stodulski, M
f
Stugu, B
b
Szczygiel, R
f
Tanaka, R
t
Tappern, G
aa
Taylor, G
q
Teng, P K
ad
Terada, S
l
Thompson, R J
p
Titov, M
h
Toczek, B
g
Tovey, D R
ac
Tricoli, A
v
Turala, M
f
Turner, P R
o
Tyndel, M
aa
Ullan M
a
Unno, Y
l
Van der Kraaij, E
s
van Vulpen, I
s
Viehhauser, G
v
Villani, E G
aa
Vorobel, V
w
Vos, M
ah
Wallny, R
e
Warren, M R M
af
Wastie, R L
v
Weber, M
aa
Weidberg, A R
v
Weilhammer, P
e
Wells, P S
e
Wilder, M
ab
Wilhelm, I
w
Wilson, J A
c
Wolter, M
f
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CBL Ceramics Ltd, Milford Haven, UK.
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The SCT Institutes responsible for the sensor acceptance tests were Bergen and Cambridge Universities and KEK.
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The SCT on-wafer ASIC testing was carried out at CERN, the Rutherford Appleton Laboratory and the University of California, Santa Cruz.
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Nippon Mektron, Co. Ltd., 1-12-15 Shiba-Daimon, Minato-ku, Tokyo, Japan.
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Seiko Precision Inc., 1864 Ienaka, Tsuga-machi, Shimo-Tsuga-gun, Tochigi, Japan.
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The assembly of ASICs to hybrids took place at the University of Birmingham, Seiko Precision, Japan, and the University of California, Santa Cruz.
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33750808241
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The SCT barrel module assembly and test clusters were in Japan (KEK, Hamamtsu Photonics, Seiko Precision, the Universities of Hiroshima, Kyoto education, Okayama and Tsukuba), Scandinavia (the Universities of Bergen, Oslo and Uppsala), the UK (the Universities of Birmingham and Cambridge, Queen Mary, London, Rutherford Appleton Laboratory) and the US (Lawrence Berkeley Laboratory, University of California, Santa Cruz). The numbers of module assemblies started in each cluster were, respectively, 980, 320, 720 and 580.
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All modules were mounted and tested on the barrels by members of the SCT collaboration at the University of Oxford, UK.
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B. Mikulec, et al., Temperature behaviour and uniformity of SCT barrels during assembly and reception testing, ATLAS Note, in preparation.
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