Scanning probes entering data storage: From promise to reality

NanoSingapore 2006: IEEE Conference on Emerging Technologies - Nanoelectronics - Proceedings

Volumn 2006, Issue , 2006, Pages 39-44

  Pozidis, H ^a   Bachtold P ^a   Bonan, J ^a   Cherubini, G ^a   Eleftheriou, E ^a   Despont, M ^a   Drechsler, U ^a   Durig U ^a   Gotsmann, B ^a   Haberle W ^a   Hagleitner, C ^a   Jubin, D ^a   Knoll, A ^a   Lantz, M A ^a   Pantazi, A ^a   Rothuizen, H E ^a   Sebastian, A ^a   Stutz, R ^a   Wiesmann, D W ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (OPTICAL); INDENTATION; MICROELECTROMECHANICAL DEVICES; PROBES; SCANNING; SOFTWARE PROTOTYPING;

HIGH PRECISION; NARROW SPACING; POLYMER FILMS; SCANNING PROBES;

DATA STORAGE EQUIPMENT;

EID: 33750804161     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANOEL.2006.1609687     Document Type: Conference Paper

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