Rigorous diffraction theory applied to microlenses

Journal of Modern Optics

Volumn 45, Issue 7, 1998, Pages 1395-1403

  Blattner, P ^a   Herzig, H P ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038009991     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349808230636     Document Type: Article

References (12)

1. Völkel, R., Herzig, H. P., Nussbaum, Ph., Blattner, P., Dändliker, R., Cullmann, E., and Hugle, W. B., 1997. Microelectron. Engng, 35:513
2. Stamnes, J. J., 1986. Waves in Focal Regions, Bristol:Adam Hilger.
3. Hirayama, K., Glytsis, E. N., Gaylord, T. K., and Wilson, D. W., 1996. J. opt. Soc. Am. A, 13:2219
4. Schmitz, M., and Bryngdahl, O., 1997. J. opt. Soc. Am. A, 14:901
5. Tabbara, W., 1973. J. opt. Soc. Am., 63:17
6. Wang, A., and Prata, A., Jr. 1995. J. opt. Soc. Am. A, 12:1161
7. Moharam, M. G., and Gaylord, T. K., 1982. J. opt. Soc. Am., 72:1385
8. Li, L., 1993. J. mod. Optics, 40:553
9. Morf, R. H., 1995. J. opt. Soc. Am. A, 12:103
10. Turunen, J., 1997. Micro-optics, Edited by:Herzig, H. P., London:Taylor & Francis.
11. Kozaki, S., 1982. J. appl. Phys., 53:7195
12. Li, Y., and Wolf, E., 1981. Optics Commun., 39:211