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Volumn 56, Issue SUPPL. 2, 2006, Pages
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Measurements of plasma parameters during BaxSr1-x TiO3 thin films deposition by double hollow cathode plasma jet system
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Author keywords
BSTO thin films; Emission spectroscopy; Hollow cathode sputtering; Langmuir probe
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Indexed keywords
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EID: 33750691055
PISSN: 00114626
EISSN: 15729486
Source Type: Journal
DOI: 10.1007/s10582-006-0363-4 Document Type: Conference Paper |
Times cited : (1)
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References (7)
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