A hard X-ray KB-FZP microscope for tomography with Sub-100-nm resolution

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 6318, Issue , 2006, Pages

  Rau, C ^a,b,c,d   Crecea, V ^b   Richter, C P ^e   Peterson, K M ^b   Jemian, P R ^b   Neuhausler U ^f   Schneider, G ^g   Yu, X ^b   Braun, P V ^b   Chiang, T C ^b   Robinson, I K ^h  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b University of Illinois at Urbana Champaign   (United States)

^c PURDUE UNIVERSITY   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^e NORTHWESTERN UNIVERSITY   (United States)

^f BIELEFELD UNIVERSITY   (Germany)

^g HAHN MEITNER INSTITUT   (Germany)

^h UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Fresnel zone plate; Full field microscopy; Hard x rays; Kirkpatrick baez mirror; Tomography

Indexed keywords

ELECTRON ENERGY LEVELS; IMAGING SYSTEMS; MIRRORS; OPTICAL RESOLVING POWER; PHOTONS; X RAY MICROSCOPES;

FRESNEL ZONE PLATES (FZP); FULL-FIELD MICROSCOPY; HARD X-RAYS; KIRKPATRICK-BAEZ MIRRORS;

COMPUTERIZED TOMOGRAPHY;

EID: 33750682674     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.680975     Document Type: Conference Paper

References (8)

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