μ-XRFA and μ-EXAFS measurements of organic and non-organic samples (status report)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6309, Issue , 2006, Pages

  Erko, Alexei ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

X ray absorption fine structure ( XAFS); X ray fluorescence micro analysis ( XRFA); X ray standing waves; X ray waveguides

Indexed keywords

X-RAY FLUORESCENCE MICRO-ANALYSIS; X-RAY STANDING WAVES; X-RAY WAVEGUIDES;

FLUORESCENCE; OPTICAL SYSTEMS; SYNCHROTRON RADIATION; WAVEGUIDES;

OPTICAL RESOLVING POWER;

EID: 33750681733     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.675625     Document Type: Conference Paper

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