Ion beam analysis possibilities for multilayer x-ray mirrors testing

Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya

Volumn , Issue 5, 2003, Pages 33-43

  Egorov, V K ^a   Egorov, E V ^a   Kondakov, A S ^a  

^a NONE

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EID: 0038117189     PISSN: 02073528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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