Characterization of oxide thin films using optical techniques

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 372-375

  Hao, J H ^a,b   Gao, J ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Microstructure; Optical analysis; Oxides; Thin films

Indexed keywords

CARRIER MOBILITY; HALL EFFECT; MICROSTRUCTURE; OPTOELECTRONIC DEVICES; OXIDES; PHOTOCONDUCTIVITY; TUNGSTEN COMPOUNDS;

CARRIER TRANSPORT; ENERGY BAND; OPTICAL ANALYSIS; OXIDE THIN FILMS;

THIN FILMS;

EID: 33750530836     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.06.016     Document Type: Article

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