Characterization of ultrasonic spray pyrolyzed tungsten oxide thin films

Thin Solid Films

Volumn 370, Issue 1, 2000, Pages 38-44

  Patil, P S ^a   Patil, P R ^b   Ennaoui, E A ^c  

^a SHIVAJI UNIVERSITY   (India)

^b SPK College   (India)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; ELECTRIC PROPERTIES; FILM PREPARATION; GRAIN SIZE AND SHAPE; PYROLYSIS; SPRAYING; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

AMMONIUM METATUNGSTATE SOLUTION; AMORPHOUS GLASS SUBSTRATES; OPTOELECTRONIC PROPERTIES; TIME RESOLVED MICROWAVE CONDUCTIVITY; TUNGSTEN OXIDE; ULTRASONIC SPRAY PYROLYSIS;

THIN FILMS;

EID: 0033707755     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00745-8     Document Type: Article

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