Quantitative methods for nanopowders characterization

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 204-208

  Wejrzanowski, T ^a   Pielaszek, R ^b   Opalinska A ^a,b   Matysiak, H ^a   Lojkowski W ^b   Kurzydlowski K J ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

Author keywords

Image analysis; Powder characterization; X ray diffraction

Indexed keywords

CATALYSIS; DISPERSIONS; PARTICLE SIZE ANALYSIS; POWDER METALS; TOPOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

NANOPOWDER; POWDER CHARACTERIZATION; SURFACE TOPOLOGY; VISIBLE LIGHT;

NANOSTRUCTURED MATERIALS;

EID: 33750520368     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.089     Document Type: Article

References (9)

1. Groza J.R., and Dowding R.J. Nanostruct. Mater. 7 7 (1996) 749
2. Michalski J., Wejrzanowski T., Pielaszek R., Konopka K., Łojkowski W., and Kurzydłowski K.J. Application of images analysis for characterization of powders. Mater. Sci. 23 1 (2005) 79
3. R. Pielaszek, Analytical expression for diffraction line profile for polydispersive powders, Appl. Crystallography, Proceedings of the XIX Conference, Kraków, Poland, September 2003. p. 43.
4. Serra J. Image Analysis and Mathematical Morphology (1982), Academic Press, London
5. Wejrzanowski T., and Kurzydlowski K.J. Stereology of grains in nano-crystals. Solid State Phenom. 94 (2003) 221
6. Kurzydłowski K.J., and Ralph B. Quantitave Description of the Microstructure of Materials (1995), CRC Press, Baton Rouge, USA
7. Wilson A.J.C. X-ray Optics (1962), Methuens, London
8. Pielaszek R. J. Alloys Compd. 382 (2004) 128
9. Bondioli F., Ferrari A.M., Braccini S., Leonelli C., Pellacani G.C., Opalinska A., Chudoba T., Grzanka E., Palosz B., and Lojkowski W. Solid State Phenom. 94 (2003) 193