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Volumn 94, Issue , 2003, Pages 221-228

Stereology of grains in nano-crystals

Author keywords

Grain size and shape; Image analysis; Nano crystals; Stereology

Indexed keywords

COMPUTER AIDED ANALYSIS; DENSITY (SPECIFIC GRAVITY); GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; MATHEMATICAL MODELS; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS;

EID: 0344495280     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.94.221     Document Type: Conference Paper
Times cited : (21)

References (7)
  • 2
    • 0003979549 scopus 로고
    • Quantitative description of the microstructure of materials
    • CRC Press, Baton Rouge, USA
    • K.J. Kurzydlowski, and B. Ralph, Quantitative description of the microstructure of materials, CRC Press, Baton Rouge, USA, 1995.
    • (1995)
    • Kurzydlowski, K.J.1    Ralph, B.2
  • 4
    • 0001964002 scopus 로고
    • The yield and flow stress dependence on polycrystal grain size
    • Applied Science Publishers, London
    • R.W. Armstrong: The yield and flow stress dependence on polycrystal grain size, Yield, Flow and Fracture of Polycrystals, Applied Science Publishers, London, 1983.
    • (1983) Yield, Flow and Fracture of Polycrystals
    • Armstrong, R.W.1
  • 5
    • 0345709541 scopus 로고    scopus 로고
    • Dislocation structure and crystallite size distribution in plastically deformed metals determined by diffraction peak profile analysis
    • T. Ungar, G. Ribarik, J. Gubicza, P. Hanak: Dislocation structure and crystallite size distribution in plastically deformed metals determined by diffraction peak profile analysis, Journal of Engineering Materials and Technology; 124, 2, 2002.
    • (2002) Journal of Engineering Materials and Technology , vol.124 , pp. 2
    • Ungar, T.1    Ribarik, G.2    Gubicza, J.3    Hanak, P.4
  • 6
    • 84902972049 scopus 로고
    • Stereological ratio estimation based on counts from integral test system
    • E.B. Jensen and H.J.G. Gundersen: Stereological ratio estimation based on counts from integral test system, Journal of Microscopy, 51, 125, 1982.
    • (1982) Journal of Microscopy , vol.51 , pp. 125
    • Jensen, E.B.1    Gundersen, H.J.G.2
  • 7
    • 84902957896 scopus 로고    scopus 로고
    • Master, Warsaw University of Technology
    • T. Wejrzanowski: Master, Warsaw University of Technology, 2000.
    • (2000)
    • Wejrzanowski, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.