Novel time-of-flight spectrometer for the analysis of positron annihilation induced Auger electrons

Review of Scientific Instruments

Volumn 77, Issue 10, 2006, Pages

  Hugenschmidt, Christoph ^a   Legl, Stefan ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRONS; FLIGHT DYNAMICS; POSITRONS; SIGNAL TO NOISE RATIO; SURFACE PROPERTIES;

ENERGY RESOLUTION; POSITRON BEAMS; TIME-OF-FLIGHT (TOF) SPECTROMETER;

SPECTROMETERS;

EID: 33750496641     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2356861     Document Type: Conference Paper

References (9)

1. A. Weiss, R. Mayer, M. Jibaly, C. Lei, D. Mehl, and K. G. Lynn, Phys. Rev. Lett. 61, 2245 (1988).
2. D. Mehl, A. R. Köymen, K. O. Jensen, F. Gotwald, and A. Weiss, Phys. Rev. B 41, 799 (1990).
3. A. Weiss, S. Yang, H. Q. Zhou, E. Jung, and S. Wheeler, J. Electron Spectrosc. Relat. Phenom. 72, 305 (1995).
4. T. Ohdaira, R. Suzuki, and T. Mikado, Surf. Sci. 433, 239 (1999).
5. C. Hugenschmidt, K. Schreckenbach, M. Stadlbauer, and B. Straáer, Nucl. Instrum. Methods Phys. Res. A 554, 384 (2005).
6. C. Hugenschmidt, B. Straßer, and K. Schreckenbach, Radiat. Phys. Chem. 68, 627 (2003).
7. N. Jiang, MS thesis, The Universtiy of Texas at Arlington, 1999.
8. S. Xie, MS thesis, The Universtiy of Texas at Arlington, 2002.
9. A. Weiss, E. Jung, J. H. Kim, A. Nangia, R. Venkataraman, S. Starnes, and G. Brauer, Appl. Surf. Sci. 116, 311 (1997).