Evolution of surface morphology in TiNiCu shape memory thin films

Applied Physics Letters

Volumn 89, Issue 17, 2006, Pages

  Fu, Y Q ^a   Sanjabi, S ^a   Barber, Z H ^a   Clyne, T W ^a   Huang, W M ^b   Cai, M ^c   Luo, J K ^a   Flewitt, A J ^a   Milne, W I ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MARTENSITIC TRANSFORMATION; SHAPE MEMORY THIN FILMS; STRESS EVOLUTION;

COMPRESSIVE STRENGTH; MARTENSITE; SHAPE MEMORY EFFECT; SURFACES; TENSILE STRESS; THIN FILMS;

SEMICONDUCTING FILMS;

EID: 33750450846     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2361275     Document Type: Article

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