An XAS study of the defect structure of Ti-doped α-Cr2O3

Solid State Ionics

Volumn 177, Issue 33-34, 2006, Pages 2939-2944

  Blacklocks, Aran N ^b   Atkinson, Alan ^a   Packer, Robert J ^a   Savin, Shelley L P ^b   Chadwick, Alan V ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF KENT   (United Kingdom)

Author keywords

Chromium oxide; EXAFS; Gas sensor; Point defects; XANES; XAS

Indexed keywords

CHEMICAL SENSORS; CRYSTAL LATTICES; DOPING (ADDITIVES); OXIDATION; POINT DEFECTS; TITANIUM; X RAY ANALYSIS;

CHROMIUM OXIDE; EXAFS; HOST LATTICE; X-RAY ABSORPTION SPECTROSCOPY (XAS); XANES;

CHROMIUM COMPOUNDS;

EID: 33750435894     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2006.08.028     Document Type: Article

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