Defect properties of Ti-doped Cr2O3

Solid State Ionics

Volumn 177, Issue 19-25 SPEC. ISS., 2006, Pages 1767-1770

  Atkinson, Alan ^a   Levy, Mark R ^a   Roche, Severine ^a   Rudkin, Robert A ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Chromium oxide; Conductivity; Defects; Gas sensor

Indexed keywords

CHROMIUM OXIDE; CONDUCTIVITY MEASUREMENTS; SEMICONDUCTIVITY;

CHEMICAL SENSORS; COMPUTER SIMULATION; CRYSTAL DEFECTS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; X RAY DIFFRACTION ANALYSIS;

CHROMIUM COMPOUNDS;

EID: 33750009657     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2005.11.015     Document Type: Article

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