The spectral response of silicon X-ray detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 568, Issue 1, 2006, Pages 1-11

  Eggert, T ^a   Boslau, O ^a   Kemmer, J ^a   Pahlke, A ^a   Wiest, F ^a  

^a KETEK GMBH   (Germany)

Author keywords

Background; BESSY 2; Incomplete charge collection; Partial events; SDD; Si(Li); Silicon drift detector

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; SILICON; SPECTRUM ANALYSIS; SYNCHROTRON RADIATION;

FANO NOISE; GAUSSIAN FEATURES; SEMICONDUCTOR DETECTOR; X RAY DETECTORS;

SENSORS;

EID: 33750333267     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.07.011     Document Type: Article

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