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Volumn 512, Issue 1-2, 2003, Pages 257-264

Analysis of background events in Silicon Drift Detectors

Author keywords

Partial events; Peak to background ratio; Silicon Drift Detector

Indexed keywords

DETECTORS; ELECTRIC POTENTIAL; SILICON;

EID: 0142095128     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01902-8     Document Type: Conference Paper
Times cited : (14)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.