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Volumn 54, Issue SUPPL. 1, 2005, Pages

Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates

Author keywords

Chemical vapour deposition; Single walled carbon nanotubes; Suspended growth

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SILICON OXIDES; SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 33750219031     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/54.suppl_1.i3     Document Type: Conference Paper
Times cited : (15)

References (10)
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  • 2
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    • Homma, Y.1    Yamashita, T.2    Finnie, P.3    Tomita, M.4    Ogino, T.5
  • 4
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    • Mechanism of brigh selective imaging of single-walled carbon nanotubes on insulators by scanning electron microscopy
    • Homma Y, Suzuki S, Kobayashi Y, Nagase M, and Takagi D (2004) Mechanism of brigh selective imaging of single-walled carbon nanotubes on insulators by scanning electron microscopy. Appl. Phys. Lett. 84: 1750-1752.
    • (2004) Appl. Phys. Lett. , vol.84 , pp. 1750-1752
    • Homma, Y.1    Suzuki, S.2    Kobayashi, Y.3    Nagase, M.4    Takagi, D.5
  • 6
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    • An enhanced CVD approach to extensive nanotube networks with directionality
    • Franklin N R, and Dai H (2000) An enhanced CVD approach to extensive nanotube networks with directionality. Adv. Mater. 12: 890-894.
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    • Franklin, N.R.1    Dai, H.2
  • 7
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    • Growth of suspended carbon nanotube networks on 100-nm-scale silicon pillars
    • Homma Y, Yamashita T, Kobayashi Y, and Ogino T (2002) Growth of suspended carbon nanotube networks on 100-nm-scale silicon pillars. Appl. Phys. Lett. 81: 2261-2268.
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 2261-2268
    • Homma, Y.1    Yamashita, T.2    Kobayashi, Y.3    Ogino, T.4
  • 8
    • 3142774262 scopus 로고    scopus 로고
    • Selective growth of individual single-walled carbon nanotubes suspended between pillar structures
    • Takagi D, Homma Y, and Kobayashi Y (2004) Selective growth of individual single-walled carbon nanotubes suspended between pillar structures. Physica E 24: 1-5.
    • (2004) Physica E , vol.24 , pp. 1-5
    • Takagi, D.1    Homma, Y.2    Kobayashi, Y.3
  • 10
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    • High-resolution, low-voltage SEM for true surface imaging and analysis
    • Jaksch H and Martin J P (1995) High-resolution, low-voltage SEM for true surface imaging and analysis. Fresenius Anal. Chem. 353: 378-382.
    • (1995) Fresenius Anal. Chem. , vol.353 , pp. 378-382
    • Jaksch, H.1    Martin, J.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.