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Applied Spectroscopy

Volumn 60, Issue 10, 2006, Pages

Nanoparticle mass spectrometry: Pushing the limit of single particle analysis

(3) Johnston, Murray V a Wang, Shenyi a Reinard, Melissa S a

a UNIVERSITY OF DELAWARE (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PRESSURE; ELECTRON MICROSCOPY; INFORMATION MANAGEMENT; IONS; MASS SPECTROMETRY; PARTICLE SIZE ANALYSIS;

ON-LINE SINGLE PARTICLE ANALYSIS; PARTICLE CONCENTRATORS; PARTICLE NUMBER;

NANOSTRUCTURED MATERIALS;

EID: 33750183043 PISSN: 00037028 EISSN: None Source Type: Journal
DOI: 10.1366/000370206778664671 Document Type: Article

Times cited : (20)

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