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Analytical Chemistry

Volumn 73, Issue 22, 2001, Pages 5403-5414

Measurement of individual particle atomic composition by aerosol mass spectrometry

(2) Reents Jr , W D a Schabel, M J a

a LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARTICLE COMPOSITIONAL ANALYSIS;

AEROSOLS; ATOMS; MASS SPECTROMETERS; SODIUM CHLORIDE; TRACE ELEMENTS;

COMPOSITION;

AMMONIUM SULFATE; SILICON DIOXIDE; SODIUM CHLORIDE; TRACE ELEMENT;

ACCURACY; AEROSOL; ARTICLE; CHEMICAL ANALYSIS; CONCENTRATION (PARAMETERS); INSTRUMENTATION; MASS SPECTROMETRY; MEASUREMENT; PARTICULATE MATTER; QUANTITATIVE ASSAY;

AEROSOLS; AIR POLLUTION; AMMONIUM SULFATE; EQUIPMENT DESIGN; MASS SPECTROMETRY; PARTICLE SIZE; SILICON DIOXIDE; SODIUM CHLORIDE;

EID: 0035891342 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac010436c Document Type: Article

Times cited : (35)

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