In situ studies of semiconductor nanowire growth using optical reflectometry

Applied Physics Letters

Volumn 89, Issue 16, 2006, Pages

  Clement, T ^a   Ingole, S ^a   Ketharanathan, S ^b   Drucker, Jeff ^b   Picraux, S T ^a,c  

^a Arizona State University   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC WIRE; LIGHT SCATTERING; REFLECTOMETERS; SEMICONDUCTOR GROWTH;

INCUBATION TIME; NANOWIRES; OPTICAL REFLECTANCE; OPTICAL REFLECTOMETRY;

NANOSTRUCTURED MATERIALS;

EID: 33750178353     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2364121     Document Type: Article

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