Comparative study of textured diamond films by thermal conductivity measurements

Applied Physics A: Materials Science and Processing

Volumn 85, Issue 3, 2006, Pages 331-335

  Govindaraju, N ^a,c   Aleksov, A ^a   Li, X ^a   Okuzumi, F ^a   Wolter, S D ^a   Collazo, R ^a   Prater, J T ^b   Sitar, Z ^a  

^a North Carolina State University   (United States)

^b U S ARMY RESEARCH OFFICE   (United States)

^c UNIVERSITY OF CINCINNATI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; MEASUREMENT THEORY; MICROWAVES; TEXTURES; THERMAL CONDUCTIVITY;

BAND GAP; FIBER TEXTURE; MICROWAVE PLASMA; SILICON ON DIAMOND (SOD) TECHNOLOGY;

DIAMOND FILMS;

EID: 33750162706     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-006-3697-7     Document Type: Article

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