Structural characterization of mixed Ta-Re oxide films

Solid State Ionics

Volumn 177, Issue 19-25 SPEC. ISS., 2006, Pages 1887-1891

  Purans, J ^a,b   Kuzmin, A ^b   Kalendarev, R ^b   Cazzanelli, E ^c   Castriota, M ^c  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF LATVIA   (Latvia)

^c UNIVERSITY OF CALABRIA   (Italy)

Author keywords

Raman spectroscopy; Rhenium oxide; Tantalum oxide; XRD

Indexed keywords

CRYSTALLIZATION; MAGNETRON SPUTTERING; RAMAN SPECTROSCOPY; RHENIUM COMPOUNDS; TANTALUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLIZED PHASE; MAGNETRON CO-SPUTTERING; SOLID PHASE; STRUCTURAL EVOLUTION;

THIN FILMS;

EID: 33749993495     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2006.07.018     Document Type: Article

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