Atomic force microscopy using small cantilevers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3009, Issue , 1997, Pages 43-47

  Walters, Deron A ^a   Viani, Mario ^a   Paloczi, George T ^a   Schäffer, Tilman E ^a   Cleveland, Jason P ^b   Wendman, Mark A ^b   Gurley, Gus ^b   Elings, Virgil B ^b   Hansma, Paul K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Digital Instruments   (United States)

Author keywords

Atomic force microscopy; Cantilevers; Crystal growth; High speed; Microfabrication; Protein

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; COMPOSITE MICROMECHANICS; CRYSTAL GROWTH; CRYSTALLIZATION; GRAIN BOUNDARIES; GROWTH (MATERIALS); MACHINING; MICROANALYSIS; MICROFABRICATION; MICROMACHINING; NATURAL FREQUENCIES; THICKNESS MEASUREMENT;

CANTILEVERS; FORCE MICROSCOPY; HIGH SPEED; IN-SITU; NEW GENERATION; PROTEIN; RESOLUTION IMAGING; SPRING CONSTANTS; STEP EDGES; TAPPING MODE (TM);

NANOCANTILEVERS;

EID: 33749821200     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.271227     Document Type: Conference Paper

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