Scanning transmission electron microscope study on vertically correlated InGaAs/GaAs quantum dots

Applied Physics Letters

Volumn 89, Issue 2, 2006, Pages

  Sauerwald, A ^a   Kummell T ^a   Peskes, D ^a   Bacher, G ^a   Loffler A ^b   Reithmaier, J P ^b   Forchel, A ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

QUANTUM INFORMATION PROCESSING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPACER LAYER THICKNESS;

ELECTRIC LINES; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; GALLIUM ALLOYS; PROBABILITY; QUANTUM THEORY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTOR QUANTUM DOTS;

EID: 33749683405     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2221890     Document Type: Article

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