Photon counting statistics for blinking CdSe-ZnS quantum dots: A lévy walk process

Journal of Physical Chemistry B

Volumn 110, Issue 38, 2006, Pages 19053-19060

  Margolin, G ^a   Protasenko, V ^a   Kuno, M ^a   Barkai, E ^b  

^a UNIVERSITY OF NOTRE DAME   (United States)

^b BAR ILAN UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION; PHOTONS; SEMICONDUCTOR QUANTUM DOTS;

CONTINUOUS WAVE LASER FIELDS; STANDARD DATA ANALYSIS; TIME DISTRIBUTIONS;

CADMIUM COMPOUNDS;

EID: 33749643824     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp061487m     Document Type: Article

References (62)

1. Barkai, E.; Jung, Y.; Silbey, R. Annu. Rev. Phys. Chem. 2004, 55, 457.
2. Lippitz, M. Kluzer, F.; Orrit, M. ChemPhysChem 2005, 6, 770.
3. Mandel, L.; Wolf, E. Optical Coherence and Quantum Optics; Cambridge University Press: New York, 1995.
4. Plenio, M. B.; Knight, P. L. Rev. Mod. Phys. 1998, 70, 101.
5. Mandel, L. Opt. Lett. 1979, 4, 205.
6. Jung, Y.; Barkai, E.; Silbey, R. Adv. Chem. Phys. 2002, 123, 199.
7. Jung, Y.; Barkai, E.; Silbey, R. Chem. Phys. 2002, 284, 181.
8. Kuno, M.; Fromm, D. P.; Hamann, H. F.; Gallagher, A.; Nesbitt, D. J. J. Chem. Phys. 2000, 112, 3117.
9. Kuno, M.; Fromm, D. P.; Hamann, H. F.; Gallagher, A.; Nesbitt, D. J. J. Chem. Phys. 2001, 115, 1028.
10. Shimizu, K. T.; Neuhauser, R. G.; Leatherdale, C. A.; Empedocles, S. A.; Woo, W. K.; Bawendi, M. G. Phys. Rev. B 2001, 63, 205316.
11. Brokmann, X.; Hermier, J. P.; Messin, G.; Desbiolles, P.; Bouchaud, J. P:; Dahan, M. Phys. Rev. Lett. 2003, 90, 120601.
12. Margolin, G.; Barkai, E. J. Chem. Phys. 2004, 121, 1566.
13. Margolin, G.; Barkai, E. Phys. Rev. Lett. 2005, 94, 80601.
14. Margolin, G.; Barkai, E. J. Stat. Phys. 2006, 122, 137.
15. Schlegel, G.; Bohnenberger, J.; Potapova, I.; Mews, A. Phys. Rev. Lett. 2002, 88, 137401.
16. Fisher, B. R.; Eisler, H. J.; Stott, N. E.; Bawendi, M. J. J. Phys. Chem. B 2004, 108, 143.
17. Bouchaud, J. P. J. Phys. 1 (France) 1992, 2, 1705.
18. Bei, G.; Barkai, E. Phys. Rev. Lett. 2005, 94, 240602.
19. Bel, G.; Barkai, E. Phys. Rev. E 2006, 73, 16125.
20. Nirmal, M.; Dabbousi, B. O.; Bawendi, M. G.; Macklin, J. J.; Trautmanm, J. K.; Harris, T. D.; Brus, L. E. Nature 1996, 383, 802.
21. Efros, A. L.; Rosen, M. Phys. Rev. Lett. 1997, 78, 1110.
22. A slightly more general approach to blinking, also based on a charging mechanism, was suggested for capped dots in ref 26.
23. Issac, A.; von Borczyskowski, C.; Cichos, F. Phys. Rev. B 2005, 71, 161302.
24. Chung, I.; Bawendi, M. G. Phys. Rev. B 2004, 70, 165304.
25. Chung, I.; Witkoskie, J. B.; Cao, J. S.; Bawendi, M. J. Phys. Rev. E 2006, 73, 11106.
26. Verberk, R.; van Oijen, A. M.; Orrit, M. Phys. Rev. B 2002, 66, 233202.
27. Kuno, M.; Fromm, D. P.; Johnson, S. T.; Gallagher, A.; Nesbitt, D. J. Phys. Rev. B 2003, 67, 125304.
28. Frantsuzov, P. A.; Marcus, R. A. Phys. Rev. B 2005, 72, 155321.
29. Margolin, G.; Protasenko, V.; Kuno, M.; Barkai, E. Adv. Chem. Phys. 2006, 133, 327. Margolin, G.; et al. cond-mat/0506512.
30. Tang, J.; Marcus, R. A. Phys. Rev. Lett. 2005, 95, 107401.
31. Haase, M.; Hubner, C. G.; Reuther, E.; et al. J. Phys. Chem. B 2004, 108, 10455.
32. Schuster, J.; Cichos, F.; von Borczykowski, C. Appl. Phys. Lett. 2005, 87, 051915.
33. Hoogenboom, J. P.; van Dijk, E. M. H. P.; Hernando J, J.; van Hulst, N. F.; Garcia-Parajo, M. F. Phys. Rev. Lett. 2005, 95, 97401.
34. Bizzarri, A. R.; Cannistraro, S. Phys. Rev. Lett. 2005, 94, 068303
35. Didier, P.; Guidoni, L.; Bardou, F. Phys. Rev. Lett. 2005, 95, 90602.
36. Barkai, E.; Silbey, R.; Zumofen, G. Phys. Rev. Lett. 2000, 84, 5339.
37. Barkai, E.; Naumov, A. V.; Vainer, Yu. G.; Bauer, M.; Kador, L. Phys. Rev. Lett. 2003, 91, 75502.
38. Sanda, F.; Mukamel, S. Phys. Rev. E 2006, 73, 11103.
39. Zheng, Y. J.; Brown, F. L. H. J. Chem. Phys. 2004, 121, 3238.
40. Aquino, G.; Palatella, L.; Grigolini, P. Phys. Rev. Lett. 2004, 93, 50601.
41. Schriefl, J.; Clusel, M.; Carpentier, D.; Degiobanni, P. Phys. Rev. B 2005, 72, 35328.
42. Pelton, M.; Grier, D. G.; Guyot-Sionnest, P. Appl. Phys. Lett. 2004, 85, 819.
43. Verberk, R.; Orrit, M. J. Chem. Phys. 2003, 119, 2214.
44. Messin, G.; Hermier, J. P.; Giacobino, E.; Desbiolles, P.; Dahan, M. Opt. Lett. 2001, 26, 1891.
45. Bianco, S.; Grigolini, P.; Paradisi, P. J. Chem. Phys. 2005, 123, 17404.
46. Metzler, R.; Klafter, J. Phys. Rep. 2000, 339, 1.
47. Bouchaud, J. P.; Georges, A. Phys. Rep. 1990, 195, 127.
48. Klafter, J.; Shlesinger, M. F.; Zumofen, G. Phys. Today 1996, 49 (2), 33.
49. Shlesinger, M. F.; West, B. J.; Klafter, J. Phys. Rev. Lett. 1987, 58, 1100.
50. Pereira, E.; Martinhi, J. M. G.; Berberan-Santos, M. N. Phys. Rev. Lett. 2004, 93, 120201.
51. See refs 24, 25, and 52 for more on the relation between the emission of a single dot and ensemble of dots.
52. Tang, J.; Marcus, R. A. J. Chem. Phys. 2005, 123, 204511.
53. 2.
54. on/off here represent the standard deviations of the distributions of the corresponding exponents and not the errors in determination of their mean value. We also note that the on time distributions are less close to the power-law decays than the off times, partly due to the exponential cutoffs and partly due to varying intensities in the on-state (cf. Figure 1).
55. Godreche, C.; Luck, J. M. J. Stat. Phys. 2001, 104, 489.
56. Boguna, M.; Berezhkovskii, A. M.; Weiss, G. H. Physica A 2000, 282, 475.
57. Sabhapandit, S.; Majumdar, S. N.; Comtet, A. Phys. Rev. E 2006, 73, 51102.
58. Bel, G.; Barkai, E. Europhys. Lett. 2006, 74, 15.
59. Barkai, E. J. Stat. Phys., in press and DOI 10.1007/s10955-006-9109-8.
60. After our work was completed, a recent study investigated the continuous distribution of emission states from single nanocrystals. Zhang, K.; Chang, H.; Fu, A.; Alivisatos, A. P.; Yang, H. Nano Lett. 2006, 6, 843.
61. b/T decreases.
62. The observed fluctuations in the on-state intensity of a single dot cannot be accounted for by a combination of background noise, shot noise, and the binning. Indeed, the background noise, which is the same for both on and off-states, is relatively small and lies more or less within one bin in the histograms of Figure 2. The shot noise is due to Poisson statistics of photon emission, and its standard deviation is the square root of the emission mean. With the emission intensity mean in the on-state of the order of 100 photons per bin or more (cf. Figure 2), the shot noise is not wide, relative to the mean. Note that in fact not all the emitted photons are counted, and if the detection efficiency is roughly constant, then the effect of the shot noise is even weaker. Finally, if the intensity trace is dominated by the power-law distributed on and off intervals, then there should be only a small minority of bins inside which state switches, which could produce any averaged intensity value for such a bin, occur.